Biblio

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[Anonymous]  . Metody analýzy povrchů: Iontové, sondové a speciální metody, Praha: Academia, 2002, ISBN 80-200-0594-3.
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Intel  8XC196KC/8XC196KD User's manual. Intel, Corp., 1992.
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Jánský, P. - Lencová, B. - Zlámal, J.  Accurate calculations of thermionic electron gun properties. EMC 2008 – 14th European Microscopy Congress – Instrumentation and Methods, Berlin: Springer, 2008, p. 557–558, ISBN 978-3-540-85154-7.
[Anonymous]  ADVANCES IN IMAGING AND ELECTRON PHYSICS. London: Academic Press, 128, 2003, ISBN 978-0-12-014770-0.
Zobač, M.  Analysis of a high speed electron beam deflection system. Proceedings of the 9th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 2009, p. 59–63, ISSN 0861-4717.
Löwer, T.  Analysis, visualization and accurate description of an electron beam for high repeatability of industrial production processes. Proceedings of the 7th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 2003, p. 45–50.
Lenc, M. - Lencová, B.  Analytical and numerical computation of multipole components of magnetic deflector. , vol. 68, 1997, p. 4409–4414, ISSN 0034-6748.
Voges, K. - Welters, T. - Böhm, S. - Dilger, K.  The Application of Monte-Carlo Methods to Electron-Beam Interactions with Solids for the Prediction of Micromachining Capabilities. Proceedings of the 8th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 2006, p. 46–50.
Liebl, H.  Applied Charged Particle Optics. Berlin: Springer, 2008, p. 132, ISBN 978-3-540-71924-3.
Dilthey, U. - Brandenburg, A. - Smolka, G.  Assembly of hybrid micro-systems -– the SFB 440. Microsystem Technologies, Springer-Verlag, 10, 2004, p. 247–251, ISSN 1432-1858, DOI 10.1007/s00542-003-0366-z.
Atmel  AT91 ARM/Thumb-based Microcontrollers. Atmel, Corp., 2006.
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Humphries, Jr., S.  Charged Particle Beams. New York: John Wiley and Sons., Inc., 1990, ISBN 0-471-60014-8.
Dilthey, U. - Boehm, S. - Dobner, M. - Traeger, G.  Comparability and replication of electron beam welding technology using newtools of the diabeam measurement device. Proceedings of the 5th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 1997, p. 76–83.
Foley, J.D. - van Dam, A. - Feiner, S.K. - Hughes, J.F.  Computer Graphics: Principles and Practice in C. Toronto: Addison-Wesley Professional, 1995, p. 1200, ISBN 978-0201848403.
Bosch  Controller Area Network (CAN) Specification – Version 2.0. Stuttgard: Robert Bosch GmbH, 1991.
Urban, P. - Hanzelka, P. - Vlček, I. - Schmoranzer, D. - Skrbek, L.  Convective heat transport in two-phase superfluid/vapor He-4 system. LOW TEMPERATURE PHYSICS, , 44, 2018, p. 1001-1004, ISSN 1063-777X, DOI 10.1063/1.5055836. Abstract
Lagarias, J.C. - Reeds, J.A. - Wright, M.H. - Wright, P.E.  Convergence Properties of the {N}elder-{M}ead Simplex Method in Low Dimensions. SIAM Journal of Optimization, , vol. 9, 1998, p. 112–147.
Wardly, G.A.  Correction of eddy current errors in electron beam deflection. Journal of Applied Physics, , 44, 1973, p. 3766–3769.
Zobačová, J. - Zobač, M. - Oral, M. - Müllerová, I. - Frank, L.  Corrections of magnification and focusing in a cathode lens-equipped scanning electron microscope. Scanning, Mahwah NJ USA: , vol. 28, 2006, p. 155–163, ISSN 0161-0457.
Kralik, T. - Hanzelka, P. - Musilova, V. - Srnka, A. - Zobač, M.  Cryogenic apparatus for study of near-field heat transfer. REVIEW OF SCIENTIFIC INSTRUMENTS, , 82, 2011, ISSN 0034-6748, DOI 10.1063/1.3585985. Abstract
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NATIONAL INSTRUMENTS  DAQ M Series User Manual. National Instruments Corp., 2006.
Lencová, B.  Deflection aberrations of multi-stage deflection systems. Optik, , vol. 58, 1981, p. 25–35.
Vlček, I. - Zobač, M. - Dupák, L. - Dupák, J. - Kapounek, P.  Desktop electron beam welder MEBW-60/2. Fine mechanics and optics, , 53, 2008, p. 27–29, ISSN 0447-6441.
Andersson, A. - Böge, M. - Lüdeke, A. - Schlott, V. - Streun, A.  Determination of a small vertical electron beam profile and emittance at the Swiss Light Source. Nuclear Instruments and Methods in Physics Research, Elsevier, A 591, 2008, p. 437–446, DOI 10.1016/j.nima.2008.02.095. Abstract
Braverman, V. - Belozercev, V. - Bashenko, V.  Device for Automatic Seam Control. Proceedings of the 9th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 2009, p. 100–103, ISSN 0861-4717.