%0 Conference Paper
%B MC 2009 - Microscopy Conference: First Joint Meeting ofDreiländertagung and Multinational Conference on Microscopy
%D 2009
%T Electron beam induced current measurement on a specimen based in a cathode lens
%A Miroslav Horáček
%A Martin Zobač
%A Ivan Vlček
%C Graz
%I Verlag der Technischen Universität
%K cathode lens
%K elektron beam induced current
%K SEM
%K specimen bias
%K very low energy electrons
%S MC 2009 - Joint Meeting of Dreiländertagung and MultinationalCongress on Microscopy /9./
%Z Export Date: 23 January 2010Source: ARL-ASEP
%8 2009
%@ 978-3-85125-062-6