%0 Conference Paper %B MC 2009 - Microscopy Conference: First Joint Meeting ofDreiländertagung and Multinational Conference on Microscopy %D 2009 %T Electron beam induced current measurement on a specimen based in a cathode lens %A Miroslav Horáček %A Martin Zobač %A Ivan Vlček %C Graz %I Verlag der Technischen Universität %K cathode lens %K elektron beam induced current %K SEM %K specimen bias %K very low energy electrons %S MC 2009 - Joint Meeting of Dreiländertagung and MultinationalCongress on Microscopy /9./ %Z Export Date: 23 January 2010Source: ARL-ASEP %8 2009 %@ 978-3-85125-062-6