%0 Conference Proceedings
%B EMC 2008 – 14th European Microscopy Congress – Instrumentation and Methods
%D 2008
%T EMC 2008 – 14th European Microscopy Congress – Instrumentation and Methods
%E Luysberg, M.
%E Tillmann, K.
%E Weirich, T.
%C Berlin
%I Springer
%@ 978-3-540-85154-7