EMC 2008 – 14th European Microscopy Congress – Instrumentation and Methods

NadpisEMC 2008 – 14th European Microscopy Congress – Instrumentation and Methods
Publication TypeConference Proceedings
Year of Publication2008
Secondary AuthorsLuysberg, M. - Tillmann, K. - Weirich, T.
Conference NameEMC 2008 – 14th European Microscopy Congress – Instrumentation and Methods
PublisherSpringer
Conference LocationBerlin
ISBN Number978-3-540-85154-7