2008
Accurate calculations of thermionic electron gun properties. EMC 2008 – 14th European Microscopy Congress – Instrumentation and Methods, Berlin: Springer, 2008, s. 557–558, ISBN 978-3-540-85154-7.
EMC 2008 – 14th European Microscopy Congress – Instrumentation and Methods. EMC 2008 – 14th European Microscopy Congress – Instrumentation and Methods, Berlin: Springer, 2008, ISBN 978-3-540-85154-7.