Biblio

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1981
1988
Lencová, B.  Metody elektronové optiky pro elektronovou litografii. Brno: Ústav přístrojové techniky čSAV Brno, 1988.
Lawson, J.D.  The Physics of the Charged-Particle Beams. Oxford: Clarendon Press, 1988, ISBN 0-19-851719-X.
1995
1996
Lenc, M. - Lencová, B.  Metody analýzy povrchů–-elektronová mikroskopie a difrakce. Metody analýzy povrchů–-elektronová mikroskopie a difrakce, Praha: Academia, 1996, ISBN 80-200-0329-0.
1997
1998
2003
Löwer, T.  Analysis, visualization and accurate description of an electron beam for high repeatability of industrial production processes. Proceedings of the 7th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 2003, s. 45–50.
2004
Smolka, G. - Gillner, A. - Bosse, L. - Lützeler, R.  Micro electron beam welding and laser machining -– potentials of beam welding methods in the micro-system technology. Microsystem Technologies, Springer-Verlag, 10, 2004, s. 187–192, ISSN 1432-1858, DOI DOI 10.1007/s00542-003-0347-2.
2005
Jánský, P. - Lencová, B. - Zlámal, J.  Optimalizace optiky elektronové svářečky. Jemná mechanika a optika, , roč. 50, 2005, s. 46–48, ISSN 0447-6441.
2006
Bärtle, J. - Löwer, T. - von Dobeneck, D.  Electron beam welding beyond the ordinary scale. Proceedings of the 8th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 2006, s. 41–45.
Koleva, E. - Menhard, C.G. - Löwer, T. - Mladenov, G.  Emittance Calculation Based on the Current Distribution Measurements at Changes of the Beam Focusing. Proceedings of the 8th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 2006, s. 51–65.
Fath, J. - Löwer, T.  Industrial Applications of Backscattered Electrons in Modern EB-Welding Machines. Proceedings of the 8th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 2006, s. 66–69.
Reverter, F. - Li, X. - Meijer, G.C.M.  Stability and accuracy of active shielding for grounded capacitive sensors. Measurement Science and Technology, , 17 (11), 2006, s. 2884-2890, ISSN 1361-6501, DOI 10.1088/0957-0233/17/11/004.
2008
Jánský, P. - Lencová, B. - Zlámal, J.  Accurate calculations of thermionic electron gun properties. EMC 2008 – 14th European Microscopy Congress – Instrumentation and Methods, Berlin: Springer, 2008, s. 557–558, ISBN 978-3-540-85154-7.
Liebl, H.  Applied Charged Particle Optics. Berlin: Springer, 2008, s. 132, ISBN 978-3-540-71924-3.
Andersson, A. - Böge, M. - Lüdeke, A. - Schlott, V. - Streun, A.  Determination of a small vertical electron beam profile and emittance at the Swiss Light Source. Nuclear Instruments and Methods in Physics Research, Elsevier, A 591, 2008, s. 437–446, DOI 10.1016/j.nima.2008.02.095. Abstract
[Anonym]  EMC 2008 – 14th European Microscopy Congress – Instrumentation and Methods. EMC 2008 – 14th European Microscopy Congress – Instrumentation and Methods, Berlin: Springer, 2008, ISBN 978-3-540-85154-7.
Chen, Y.X. - Zhang, Y.X. - Yao, S. - Lu, F.G.  Scanning electron beam brazing of thin-wall capillary tube-sheet structure. JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, , vol. 203, 2008, s. 301–304, ISSN 0924-0136, DOI 10.1016/j.jmatprotec.2007.10.022. Abstract
Reverter, F. - Li, X. - Meijer, G.C.M.  A novel interface circuit for grounded capacitive sensors with feedforward-based active shielding. Measurement Science and Technology, , 19 (2), 2008, s. 025202, ISSN 1361-6501, DOI 10.1088/0957-0233/19/2/025202.
2009