Biblio

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Book
Liebl, H.  Applied Charged Particle Optics. Berlin: Springer, 2008, s. 132, ISBN 978-3-540-71924-3.
Lawson, J.D.  The Physics of the Charged-Particle Beams. Oxford: Clarendon Press, 1988, ISBN 0-19-851719-X.
Book Chapter
Lenc, M. - Lencová, B.  Metody analýzy povrchů–-elektronová mikroskopie a difrakce. Metody analýzy povrchů–-elektronová mikroskopie a difrakce, Praha: Academia, 1996, ISBN 80-200-0329-0.
Conference Paper
Jánský, P. - Lencová, B. - Zlámal, J.  Accurate calculations of thermionic electron gun properties. EMC 2008 – 14th European Microscopy Congress – Instrumentation and Methods, Berlin: Springer, 2008, s. 557–558, ISBN 978-3-540-85154-7.
Löwer, T.  Analysis, visualization and accurate description of an electron beam for high repeatability of industrial production processes. Proceedings of the 7th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 2003, s. 45–50.
Bärtle, J. - Löwer, T. - von Dobeneck, D.  Electron beam welding beyond the ordinary scale. Proceedings of the 8th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 2006, s. 41–45.
Koleva, E. - Menhard, C.G. - Löwer, T. - Mladenov, G.  Emittance Calculation Based on the Current Distribution Measurements at Changes of the Beam Focusing. Proceedings of the 8th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 2006, s. 51–65.
Fath, J. - Löwer, T.  Industrial Applications of Backscattered Electrons in Modern EB-Welding Machines. Proceedings of the 8th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 2006, s. 66–69.
Conference Proceedings
[Anonym]  EMC 2008 – 14th European Microscopy Congress – Instrumentation and Methods. EMC 2008 – 14th European Microscopy Congress – Instrumentation and Methods, Berlin: Springer, 2008, ISBN 978-3-540-85154-7.
Journal Article
Andersson, A. - Böge, M. - Lüdeke, A. - Schlott, V. - Streun, A.  Determination of a small vertical electron beam profile and emittance at the Swiss Light Source. Nuclear Instruments and Methods in Physics Research, Elsevier, A 591, 2008, s. 437–446, DOI 10.1016/j.nima.2008.02.095. Abstract
Smolka, G. - Gillner, A. - Bosse, L. - Lützeler, R.  Micro electron beam welding and laser machining -– potentials of beam welding methods in the micro-system technology. Microsystem Technologies, Springer-Verlag, 10, 2004, s. 187–192, ISSN 1432-1858, DOI DOI 10.1007/s00542-003-0347-2.
Reverter, F. - Li, X. - Meijer, G.C.M.  A novel interface circuit for grounded capacitive sensors with feedforward-based active shielding. Measurement Science and Technology, , 19 (2), 2008, s. 025202, ISSN 1361-6501, DOI 10.1088/0957-0233/19/2/025202.
Jánský, P. - Lencová, B. - Zlámal, J.  Optimalizace optiky elektronové svářečky. Jemná mechanika a optika, , roč. 50, 2005, s. 46–48, ISSN 0447-6441.
Chen, Y.X. - Zhang, Y.X. - Yao, S. - Lu, F.G.  Scanning electron beam brazing of thin-wall capillary tube-sheet structure. JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, , vol. 203, 2008, s. 301–304, ISSN 0924-0136, DOI 10.1016/j.jmatprotec.2007.10.022. Abstract
Reverter, F. - Li, X. - Meijer, G.C.M.  Stability and accuracy of active shielding for grounded capacitive sensors. Measurement Science and Technology, , 17 (11), 2006, s. 2884-2890, ISSN 1361-6501, DOI 10.1088/0957-0233/17/11/004.
Thesis
Lencová, B.  Metody elektronové optiky pro elektronovou litografii. Brno: Ústav přístrojové techniky čSAV Brno, 1988.