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very low energy electrons
Horáček, M. - Zobač, M. - Vlček, I.  Electron beam induced current measurement on a specimen based in a cathode lens. MC 2009 - Microscopy Conference: First Joint Meeting ofDreiländertagung and Multinational Conference on Microscopy, Graz: Verlag der Technischen Universität, 2009, ISBN 978-3-85125-062-6.
specimen bias
Horáček, M. - Zobač, M. - Vlček, I.  Electron beam induced current measurement on a specimen based in a cathode lens. MC 2009 - Microscopy Conference: First Joint Meeting ofDreiländertagung and Multinational Conference on Microscopy, Graz: Verlag der Technischen Universität, 2009, ISBN 978-3-85125-062-6.
SEM
Horáček, M. - Zobač, M. - Vlček, I.  Electron beam induced current measurement on a specimen based in a cathode lens. MC 2009 - Microscopy Conference: First Joint Meeting ofDreiländertagung and Multinational Conference on Microscopy, Graz: Verlag der Technischen Universität, 2009, ISBN 978-3-85125-062-6.
elektron beam induced current
Horáček, M. - Zobač, M. - Vlček, I.  Electron beam induced current measurement on a specimen based in a cathode lens. MC 2009 - Microscopy Conference: First Joint Meeting ofDreiländertagung and Multinational Conference on Microscopy, Graz: Verlag der Technischen Universität, 2009, ISBN 978-3-85125-062-6.
cathode lens
Horáček, M. - Zobač, M. - Vlček, I.  Electron beam induced current measurement on a specimen based in a cathode lens. MC 2009 - Microscopy Conference: First Joint Meeting ofDreiländertagung and Multinational Conference on Microscopy, Graz: Verlag der Technischen Universität, 2009, ISBN 978-3-85125-062-6.