Biblio
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Strong Near-Field Enhancement of Radiative Heat Transfer between Metallic Surfaces. PHYSICAL REVIEW LETTERS, ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA: AMER PHYSICAL SOC, 109, 2012, ISSN 0031-9007, DOI 10.1103/PhysRevLett.109.224302. Abstract
Investigation of Electron Beam Profiling of Metal Surfaces. Proceedings of the 9th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 2009, s. 152–155, ISSN 0861-4717.
New Electron Beam Multi-Process Technologies for the Liquid Phase Surface Treatment of Aluminium Materials. Proceedings of the 9th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 2009, s. 123–127, ISSN 0861-4717.
Corrections of magnification and focusing in a cathode lens-equipped scanning electron microscope. Scanning, Mahwah NJ USA: , vol. 28, 2006, s. 155–163, ISSN 0161-0457.
Industrial Applications of Backscattered Electrons in Modern EB-Welding Machines. Proceedings of the 8th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 2006, s. 66–69.
A new generation of power supplies for electron beam welding machines. Vacuum, , vol. 77, 2005, s. 463–467, ISSN 0042-207X, DOI 10.1016/j.vacuum.2004.09.003. Abstract
A new generation of power supplies for electron beam welding machines. Proceedings of the 7th International Conference on Electron Beam Technologies, Varna: Bulgarian Academy of Sciencies, 2003, s. 631–632.
Mikroskopie pomalými elektrony. Metody analýzy povrchů: Iontové, sondové a speciální metody, Praha: Academia, 2002, ISBN 80-200-0594-3" PAGES = "383-–455.
Emittance of high-power-density electron beam. Vacuum, , 55, 1999, s. 223–233, ISSN 0042-207X, DOI 10.1016/S0042-207X(99)00161-X. Abstract
The optimization of a triode electron gun with a thermionic cathode. Vacuum, , 111, 1997, s. 126–134. Abstract
Metody analýzy povrchů–-elektronová mikroskopie a difrakce. Metody analýzy povrchů–-elektronová mikroskopie a difrakce, Praha: Academia, 1996, s. 67–90, ISBN 80-200-0329-0.
Metody analýzy povrchů–-elektronová mikroskopie a difrakce. Metody analýzy povrchů–-elektronová mikroskopie a difrakce, Praha: Academia, 1996, ISBN 80-200-0329-0.
Metody analýzy povrchů–-elektronová mikroskopie a difrakce. Metody analýzy povrchů–-elektronová mikroskopie a difrakce, Praha: Academia, 1996, ISBN 80-200-0329-0.
Computer Graphics: Principles and Practice in C. Toronto: Addison-Wesley Professional, 1995, s. 1200, ISBN 978-0201848403.